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Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits.

Xin LiRob A. RutenbarR. D. (Shawn) Blanton
Published in: ICCAD (2009)
Keyphrases
  • minimum cost
  • integrated circuit
  • np hard
  • special case
  • approximation algorithms
  • spanning tree
  • path planning