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On the Verification of High-Order Constraint Compliance in IC Design.

Jan B. FreuerGöran JerkeJoachim GerlachWolfgang Nebel
Published in: DATE (2008)
Keyphrases
  • high order
  • higher order
  • pairwise
  • formal methods
  • image processing
  • feature space
  • low order
  • functional verification
  • sigma delta