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Reliable Sub-nanosecond MRAM with Double Spin-torque Magnetic Tunnel Junctions.

C. SafranskiGuohan HuJ. Z. SunP. HashemiS. L. BrownL. BuziC. P. D'EmicE. R. J. EdwardsEileen A. GalliganM. G. GottwaldO. GunawanS. KarimeddinyH. JungJ. KimKenneth F. LatzkoPhilip Louis TrouilloudS. ZareDaniel Christopher Worledge
Published in: VLSI Technology and Circuits (2022)
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