Reliable Sub-nanosecond MRAM with Double Spin-torque Magnetic Tunnel Junctions.
C. SafranskiGuohan HuJ. Z. SunP. HashemiS. L. BrownL. BuziC. P. D'EmicE. R. J. EdwardsEileen A. GalliganM. G. GottwaldO. GunawanS. KarimeddinyH. JungJ. KimKenneth F. LatzkoPhilip Louis TrouilloudS. ZareDaniel Christopher WorledgePublished in: VLSI Technology and Circuits (2022)