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Derivation of Reduced Test Vectors for Bit-Parallel Multipliers over GF(2^m).

Hafizur RahamanJimson MathewDhiraj K. PradhanAbusaleh M. Jabir
Published in: IEEE Trans. Computers (2008)
Keyphrases
  • bit parallel
  • pattern matching
  • information retrieval
  • statistical tests
  • machine learning
  • case study
  • significantly reduced
  • vector space