Characterization of Organic Static Induction Transistors with Nano-Gap Gate Fabricated by Electron Beam Lithography.
Hiroshi YamauchiYasuyuki WatanabeMasaaki IizukaMasakazu NakamuraKazuhiro KudoPublished in: IEICE Trans. Electron. (2008)
Keyphrases
- carbon nanotubes
- cmos technology
- electron beam lithography
- nano scale
- electron beam
- integrated circuit
- neural network
- low power
- parallel processing
- power consumption
- x ray
- low voltage
- high speed
- machine learning
- power dissipation
- metal oxide semiconductor
- rule induction
- program synthesis
- field effect transistors
- low cost
- real time