Login / Signup

Corner-Aware Dynamic Gate Voltage Scheme to Achieve High Read Yield in STT-RAM.

Sara ChoiTaehui NaJisu KimJung Pill KimSeung-Hyuk KangSeong-Ook Jung
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
  • wide range
  • dynamic environments
  • wireless sensor networks
  • database management systems
  • dynamic response