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Thermal and electrical performance investigation of FinFET with encased air-gap gate sidewalls from spacer encapsulation layer material and structure parameter perspectives.

Ning HuangWeijing LiuQinghua LiWei BaiXiadong TangTing Yang
Published in: Microelectron. J. (2020)
Keyphrases
  • transmission line
  • infrared
  • structural information
  • data sets
  • graph structure
  • high temperature
  • electrical power
  • silicon dioxide