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Reliability analysis of InGaN Blu-Ray laser diode.
Nicola Trivellin
Matteo Meneghini
Gaudenzio Meneghesso
Enrico Zanoni
Kenji Orita
Masaaki Yuri
Tsuyoshi Tanaka
Daisuke Ueda
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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reliability analysis
ray tracing
computer simulation
light field
transmission line
light emitting
real world
condition monitoring
artificial intelligence
relational databases
fault tree