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Defect-Oriented vs. Schematic-Level Based Fault Simulation for Mixed-Signal ICs.
Thomas Olbrich
Jordi Pérez
Ian Andrew Grout
Andrew Mark David Richardson
Carles Ferrer
Published in:
ITC (1996)
Keyphrases
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mixed signal
vlsi circuits
fault detection
fault diagnosis
image processing
simulation model
low power
computer vision