A Low-Cost Jitter Measurement Technique for BIST Applications.

Jui-Jer Huang Jiun-Lang Huang

Published in: Asian Test Symposium (2003)

Keyphrases

low cost
data acquisition
low power
cost effective
real time
packet loss
search algorithm
digital camera
highly efficient
single chip
measurement error
image processing
multiresolution
rfid tags
measurement data
measurement model