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Analytical and Experimental Study of Wide Tuning Range mm-Wave CMOS LC-VCOs.

Salma ElabdS. BalasubramanianQ. WuTony QuachAji MattamanaWaleed Khalil
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2014)
Keyphrases
  • experimental study
  • wide range
  • high speed
  • experimental evaluation
  • image processing
  • parameter settings
  • low power
  • synthetic datasets
  • analog vlsi
  • d objects
  • range data
  • average error
  • rms error
  • vlsi circuits