Transistor Count Reduction by Gate Merging.

Calebe Micael de Oliveira Conceição Ricardo Augusto da Luz Reis

Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2019)

Keyphrases

silicon dioxide
integrated circuit
field effect transistors
leakage current
high speed
metal oxide semiconductor
computer vision
information systems
low power
real time
genetic algorithm
face recognition
rough set theory