Analysis and Prevention on NC-ball induced ESD Damages in a 683-Pin BGA Packaged Chipset IC.

Wen-Yu Lo Ming-Dou Ker

Published in: Microelectron. Reliab. (2003)

Keyphrases

image analysis
vision system
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neural network
multiscale
wide range
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data analysis
databases
real world
machine learning
metadata
quantitative analysis
automatic analysis