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DERA: yet another differential fault attack on cryptographic devices based on error rate analysis.

Yannan LiuJie ZhangLingxiao WeiFeng YuanQiang Xu
Published in: DAC (2015)
Keyphrases
  • error rate
  • test set
  • lower error rates
  • multi class
  • fault diagnosis
  • smart card
  • cost sensitive classification
  • fault model
  • false discovery rate
  • correct recognition rate