Computing the Detection Probability for Small Delay Defects of Nanometer ICs.
Jose Luis Garcia-GervacioVíctor H. ChampacPublished in: J. Electron. Test. (2011)
Keyphrases
- detection algorithm
- detection accuracy
- automatic detection
- probability distribution
- detection method
- false alarms
- detection rate
- jump diffusion process
- false alarm rate
- false positives
- change detection
- real time
- object detection
- end to end
- small number
- decision trees
- computer vision
- target detection
- artificial intelligence
- loss probability
- real world