Semi-supervised Metric Learning for Image Classification.
Jiwei HuChensheng SunKin-Man LamPublished in: PCM (2) (2010)
Keyphrases
- metric learning
- semi supervised
- image classification
- distance metric learning
- semi supervised clustering
- semi supervised learning
- labeled data
- pairwise
- unsupervised learning
- active learning
- unlabeled data
- feature extraction
- supervised learning
- image features
- class specific
- pairwise constraints
- multi label
- fully supervised
- distance metric
- sparse representation
- semi supervised classification
- data sets
- subject to linear constraints
- weakly supervised
- manifold learning
- sparse coding
- logic programs
- image processing