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Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning.
Swarup Bhunia
Hamid Mahmoodi-Meimand
Debjyoti Ghosh
Kaushik Roy
Published in:
ISQED (2005)
Keyphrases
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power reduction
cost effective
power consumption
built in self test
distributed systems