Login / Signup

Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning.

Swarup BhuniaHamid Mahmoodi-MeimandDebjyoti GhoshKaushik Roy
Published in: ISQED (2005)
Keyphrases
  • power reduction
  • cost effective
  • power consumption
  • built in self test
  • distributed systems