The 4DN-OME Ontology: an OME-OWL Extension with Emphasis on Usability, Minimum Information Guidelines and Quality Control for Super-resolution Fluorescence Microscopy.
Mathias HammerAlessandro RiganoFarzin FarzamMaximiliaan HuismanDavid GrunwaldCaterina Strambio-De-CastilliaPublished in: SWAT4HCLS (2019)
Keyphrases
- super resolution
- quality control
- high resolution
- low resolution
- image reconstruction
- image restoration
- high resolution images
- semantic web
- spatial information
- machine vision
- low resolution images
- natural images
- depth map
- super resolution image reconstruction
- real time
- image patches
- motion estimation
- high quality
- three dimensional