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Transversal line defects induced by an electric field in a period-2 oscillatory medium.
Jinming Luo
Jing Qiang
Xingyong Zhang
Jun Tang
Published in:
Commun. Nonlinear Sci. Numer. Simul. (2013)
Keyphrases
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electric field
space charge
defect detection
line segments
thin film transistor
defect classification
databases
data mining
recurrent neural networks
line detection
dielectric constant