Transversal line defects induced by an electric field in a period-2 oscillatory medium.

Jinming LuoJing QiangXingyong ZhangJun Tang
Published in: Commun. Nonlinear Sci. Numer. Simul. (2013)
Keyphrases
  • electric field
  • space charge
  • defect detection
  • line segments
  • thin film transistor
  • defect classification
  • databases
  • data mining
  • recurrent neural networks
  • line detection
  • dielectric constant