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Critical Path Selection for Deep Sub-Micron Delay Test and Timing Validation.
Jing-Jia Liou
Li-C. Wang
Angela Krstic
Kwang-Ting (Tim) Cheng
Published in:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2003)
Keyphrases
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critical path
job shop scheduling problem
artificial intelligence
optimal solution
artificial neural networks
multi objective