Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing.

Chih-Wen Lu Chung-Len Lee Chauchin Su Jwu-E Chen

Published in: J. Electron. Test. (2002)

Keyphrases

signal processing
knowledge base
feature vectors
image analysis
statistical analysis
real time
data mining
information systems
decision making
data analysis
high speed
correlation analysis