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An Efficient Overlapping Event Generation Method for Symmetric System Testing.

Devraj Kallappa BakchowdeNanda Kishore AS
Published in: MTV (2011)
Keyphrases
  • generation method
  • feature generation
  • test cases
  • event detection
  • computationally efficient
  • test data
  • data sets
  • neural network
  • search engine
  • multiscale
  • search algorithm
  • event logs