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Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP.
Vladimir Chepelev
Yury Parfenov
William Radasky
Boris Titov
Leonid Zdoukhov
Kejie Li
Yuhao Chen
Xu Kong
Yan-zhao Xie
Published in:
J. Electron. Test. (2018)
Keyphrases
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electronic devices
high power
low power
high density
power supply
smart phones
power consumption
mobile devices
low cost
ofdm system
neural network
high speed
end to end