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Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP.

Vladimir ChepelevYury ParfenovWilliam RadaskyBoris TitovLeonid ZdoukhovKejie LiYuhao ChenXu KongYan-zhao Xie
Published in: J. Electron. Test. (2018)
Keyphrases
  • electronic devices
  • high power
  • low power
  • high density
  • power supply
  • smart phones
  • power consumption
  • mobile devices
  • low cost
  • ofdm system
  • neural network
  • high speed
  • end to end