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Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters.
Yong Hyeon Yi
Chris H. Kim
Chen Zhou
Armen Kteyan
Valeriy Sukharev
Published in:
IRPS (2023)
Keyphrases
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power grid
power system
neural network
low cost
network structure
communication networks
data mining