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Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters.

Yong Hyeon YiChris H. KimChen ZhouArmen KteyanValeriy Sukharev
Published in: IRPS (2023)
Keyphrases
  • power grid
  • power system
  • neural network
  • low cost
  • network structure
  • communication networks
  • data mining