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Defect detection on EL images based on deep feature optimized by metric learning for imbalanced data.
Kun Liu
Jiangrui Han
Haiyong Chen
Haowei Yan
Peng Yang
Published in:
ICAC (2019)
Keyphrases
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metric learning
defect detection
imbalanced data
image features
distance function
distance metric
image classification
dimensionality reduction
multi task
image processing
pairwise
feature vectors
multi class
semi supervised
random sampling
preprocessing step