Fast Statistical Full-Chip Leakage Analysis for Nanometer VLSI Systems.
Ruijing ShenSheldon X.-D. TanHai WangJinjun XiongPublished in: ACM Trans. Design Autom. Electr. Syst. (2012)
Keyphrases
- statistical analysis
- high speed
- signal processing
- computing systems
- management system
- quantitative analysis
- complex systems
- intelligent systems
- computer systems
- single chip
- database
- correlation analysis
- statistical modeling
- statistical methods
- knowledge based systems
- data driven
- expert systems
- data analysis
- database systems
- computer vision
- neural network
- databases