VCO-Based ADC With Digital Background Calibration in 65nm CMOS.
Sulin LiJianping GongJohn A. McNeillPublished in: NEWCAS (2018)
Keyphrases
- analog to digital converter
- metal oxide semiconductor
- circuit design
- cmos technology
- mixed signal
- cmos image sensor
- low power
- silicon on insulator
- high speed
- image sensor
- single chip
- camera calibration
- low cost
- dynamic range
- foreground objects
- nm technology
- power consumption
- digital curves
- imaging systems
- focal length
- analog vlsi
- camera parameters