Login / Signup
Revisiting the application of twin connected parallel networks and regression loss functions in industrial defect detection.
Zhanzhi Su
Mingle Zhou
Min Li
Zekai Zhang
Delong Han
Gang Li
Published in:
Adv. Eng. Informatics (2024)
Keyphrases
</>
loss function
defect detection
pairwise
support vector
squared error
gradient boosting
learning to rank
reproducing kernel hilbert space
automated visual inspection
loss minimization
machine learning
logistic regression
risk minimization
image processing