An 80× Analog-Implemented Time-Difference Amplifier for Delay-Line-Based Coarse-Fine Time-to-Digital Converters in 0.18-µm CMOS.
Horng-Yuan ShihSheng-Kai LinPo-Shun LiaoPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
- circuit design
- analog to digital converter
- cmos image sensor
- mixed signal
- dynamic range
- delta sigma
- coarse to fine
- analog vlsi
- low power
- wide dynamic range
- multi channel
- single chip
- multiresolution
- power consumption
- focal plane
- low cost
- high speed
- parallel processing
- image enhancement
- digital circuits
- solid state
- image sensor
- vlsi circuits
- object detection