A Hybrid Modelling Approach for Parameter Estimation of Analytical Reflection Models in the Failure Analysis Process of Semiconductors.
Simon KammKanuj SharmaNasser JazdiMichael WeyrichPublished in: CASE (2021)
Keyphrases
- parameter estimation
- model selection
- statistical models
- em algorithm
- least squares
- random fields
- markov random field
- parameter estimation algorithm
- maximum likelihood
- model fitting
- parameter estimates
- markov chain monte carlo
- statistical model
- posterior distribution
- non stationary
- parameter values
- three dimensional
- estimation problems
- expectation maximization
- structure learning
- gibbs sampling
- parameters estimation
- image processing