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Dynamic On-Resistance and Threshold Voltage Instability Evaluation Circuit for Power GaN HEMTs Devices.
Rustam Kumar
Tian-Li Wu
Published in:
IEEE Trans. Ind. Electron. (2024)
Keyphrases
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duty cycle
single phase
power consumption
mobile devices
clock gating
dynamic environments
power system
low voltage
neural network
short circuit
image analysis
cmos technology
analog circuits
metal oxide