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Robust tests for stuck-open faults and design for testability of reconvergent fan-out CMOS logic networks.
F. Darlay
Bernard Courtois
Published in:
EURO-DAC (1990)
Keyphrases
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user interface
low cost
high speed
chip design
built in self test
knowledge based systems
design process
power consumption
network design
social networks
fault diagnosis
circuit design
peer to peer overlay