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Eliminating Re-Burn-In in semiconductor manufacturing through statistical analysis of production test data.
Hung V. Pham
Serge N. Demidenko
Giovanni M. Merola
Published in:
I2MTC (2017)
Keyphrases
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semiconductor manufacturing
test data
statistical analysis
discrete event simulation
process control
training data
test set
test cases
production system
data sets
training set
dynamic programming
image processing
training and test data
search based testing