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Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability.
J. Galiay
Yves Crouzet
M. Vergniault
Published in:
IEEE Trans. Computers (1980)
Keyphrases
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computer systems
fault models
fault management
model based diagnosis
latent semantic indexing
fault tolerance
database
horn clauses
fault model
conflict resolution
floating gate