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Analysis of double-gate FinFET-based address decoder for radiation-induced single-event-transients.

Surendra S. RathodAshok K. SaxenaSudeb Dasgupta
Published in: IET Circuits Devices Syst. (2012)
Keyphrases
  • data analysis
  • statistical analysis
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  • neural network
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  • x ray
  • infrared
  • multi channel