Sign in
Learning General Feature Descriptor for Visual Measurement With Hierarchical View Consistency.
Yuan Rao
Jian Yang
Yakun Ju
Cong Li
Eric Rigall
Hao Fan
Junyu Dong
Published in:
IEEE Trans. Instrum. Meas. (2022)
Keyphrases
</>
feature descriptors
image retrieval
co occurrence
pattern recognition
local binary pattern