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Learning General Feature Descriptor for Visual Measurement With Hierarchical View Consistency.

Yuan RaoJian YangYakun JuCong LiEric RigallHao FanJunyu Dong
Published in: IEEE Trans. Instrum. Meas. (2022)
Keyphrases
  • feature descriptors
  • image retrieval
  • co occurrence
  • pattern recognition
  • local binary pattern