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DEFECTCHECKER: Automated Smart Contract Defect Detection by Analyzing EVM Bytecode.
Jiachi Chen
Xin Xia
David Lo
John C. Grundy
Xiapu Luo
Ting Chen
Published in:
CoRR (2020)
Keyphrases
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defect detection
feature extraction
semi automated
smart card
fully automated
automated visual inspection
supply chain
source code
virtual machine
real time
computer aided
java card
data sets
context aware
smart environments
automated analysis