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Optimal bi-level quantization of i.i.d. sensor observations for binary hypothesis testing.
Qian Zhang
Pramod K. Varshney
Richard D. Wesel
Published in:
IEEE Trans. Inf. Theory (2002)
Keyphrases
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hypothesis testing
bi level
likelihood ratio
minimum probability of error
sensor data
gray scale
statistical tests
worst case
recursive algorithm
hypothesis test
robust statistical
pricing model
data sets
upper bound
null hypothesis
test statistic
data mining