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Maximum sequence test pattern generators with irreducible characteristic polynomials.

Dimitri KagarisRajesh AakuthotaAnila Verma
Published in: Microprocess. Microsystems (2006)
Keyphrases
  • pattern matching
  • sequence patterns
  • pattern discovery
  • computer vision
  • test cases
  • test data
  • data generator
  • neural network
  • database systems
  • search algorithm
  • expert systems
  • software testing
  • random numbers