A Functional Testing Method for Microprocessors.
Li ShenStephen Y. H. SuPublished in: IEEE Trans. Computers (1988)
Keyphrases
- high accuracy
- preprocessing
- experimental evaluation
- pairwise
- detection algorithm
- cost function
- computational complexity
- prior knowledge
- optimization method
- synthetic data
- significant improvement
- face recognition
- image segmentation
- learning algorithm
- main contribution
- data sets
- high precision
- test data
- mathematical model
- segmentation method
- neural network
- detection method
- clustering method
- optical flow
- computationally efficient
- mutual information
- image processing
- knn
- classification accuracy
- dynamic programming
- feature extraction