Extracting analytical nonlinear models from analog circuits by recursive vector fitting of transfer function trajectories.
Dimitri de JongheDirk DeschrijverTom DhaeneGeorges G. E. GielenPublished in: DATE (2013)
Keyphrases
- transfer function
- analog circuits
- nonlinear models
- digital circuits
- fault diagnosis
- linear model
- linear models
- image enhancement
- logistic regression
- statistical models
- contrast enhancement
- neural network
- least squares
- moving objects
- real time
- image analysis
- pattern recognition
- parameter estimation
- data flow
- control law
- image processing