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Application of a Design for Delay Testability Approach to High Speed Logic LSIs.

Kazumi HatayamaMitsuji IkedaMasahiro TakakuraSatoshi UchiyamaYoriyuki Sakamoto
Published in: Asian Test Symposium (1997)
Keyphrases
  • high speed
  • data sets
  • software architecture
  • neural network
  • user interface
  • design process
  • engineering design
  • database
  • real time
  • genetic algorithm
  • logic programming
  • building blocks
  • design principles