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Improving Memory Reliability by Bounding DRAM Faults: DDR5 improved reliability features.

Kjersten CrissKuljit BainsRajat AgarwalTanj BennettTerry GrunzkeJangryul Keith KimHoeju ChungMunseon Jang
Published in: MEMSYS (2020)
Keyphrases
  • main memory
  • database systems
  • low level
  • feature space
  • control system
  • feature set
  • failure rate
  • reliability analysis
  • feature extraction
  • feature vectors
  • upper bound
  • input output
  • data center