Clustered defect detection of high quality chips using self-supervised multilayer perceptron.
Chenn-Jung HuangPublished in: Expert Syst. Appl. (2007)
Keyphrases
- multilayer perceptron
- defect detection
- high quality
- neural network
- artificial neural networks
- back propagation
- radial basis function
- input vector
- neural network model
- hidden layer
- probabilistic neural networks
- automated visual inspection
- feature extraction
- radial basis function network
- commonly applied
- textured surfaces
- radial basis function neural network
- rbf network
- feedforward neural networks
- integrated circuit
- activation function
- modular neural network
- backpropagation algorithm
- small number
- neuro fuzzy models
- input vectors
- feed forward
- high speed
- support vector
- face recognition