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Built-in self-test for phase-locked loops.

Chun-Lung HsuYi-Ting LaiShu-Wei Wang
Published in: IEEE Trans. Instrum. Meas. (2005)
Keyphrases
  • phase locked
  • built in self test
  • integrated circuit
  • social networks
  • relational databases
  • generative model
  • high dimensional data
  • binary images