On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs.
Mehdi RzinAlessandro ChiniCarlo De SantiMatteo MeneghiniA. HuggerM. HollmerH. StieglauerM. MadelJ. SplettstößerD. SommerJan GrünenpüttK. BeilenhoffHervé BlanckJ.-T. ChenO. KordinaGaudenzio MeneghessoEnrico ZanoniPublished in: Microelectron. Reliab. (2018)
Keyphrases
- radio frequency
- finite element
- semiconductor manufacturing
- integrated circuit
- relevance feedback
- soft tissue
- massively parallel
- experimental data
- chemical reaction
- room temperature
- learning rate
- pattern recognition
- structuring elements
- finite element model
- data sets
- database
- protein folding
- stress distribution
- active learning
- knowledge base
- computer vision
- machine learning
- neural network
- real time