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Efficient DFA-Resistant AES Hardware Based on Concurrent Fault Detection Scheme.

Rei UenoYusuke YagyuNaofumi Homma
Published in: ISMVL (2023)
Keyphrases
  • detection scheme
  • low cost
  • real time
  • image processing
  • neural network
  • information systems
  • lightweight
  • cost effective
  • fault detection
  • fault model