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Degradation of vertical GaN FETs under gate and drain stress.

Maria RuzzarinMatteo MeneghiniCarlo De SantiGaudenzio MeneghessoEnrico ZanoniMin SunTomás Palacios
Published in: IRPS (2018)
Keyphrases
  • structuring elements
  • early warning
  • machine learning
  • multiscale
  • evolutionary algorithm
  • multiple input
  • nano scale
  • hidden markov models
  • image quality
  • stress distribution