Fully convolutional networks for chip-wise defect detection employing photoluminescence images.
Maike Lorena SternMartin SchellenbergerPublished in: J. Intell. Manuf. (2021)
Keyphrases
- defect detection
- image analysis
- image data
- image classification
- image database
- three dimensional
- image matching
- image retrieval
- ground truth
- rigid body
- image registration
- input image
- object recognition
- edge detection
- textured surfaces
- multiple images
- image features
- segmentation method
- segmentation algorithm
- test images
- lighting conditions
- image collections
- pairwise
- multiscale