Parallelizing a Defect Detection and Categorization Application.

Leonid Glimcher Gagan Agrawal Sameep Mehta Ruoming Jin Raghu Machiraju

Published in: IPDPS (2005)

Keyphrases

defect detection
information systems
databases
information retrieval
neural network
real world
learning algorithm
social networks
decision making
knowledge base
database systems
bayesian networks